1. After connecting the instrument's power cord, turn on the power switch, connect the appropriate test fixture, and warm up for 10 minutes.
2. Adjust the brightness of the light beam on the instrument's display to an appropriate level using the "Intensity" knob, but avoid excessive brightness to prevent damage to the oscilloscope tube; use the "Focus" and "Auxiliary Focus" knobs to make the beam as fine and clear as possible to improve reading accuracy; use the horizontal and vertical position knobs to move the beam to the center of the bottom horizontal line on the screen, aligning it with the bottom line for convenient reading during testing.
3. According to the test conditions required for the transistor under test, set the relevant test conditions using the knobs and buttons on the instrument panel.
4. Insert the transistor under test into the port on the test fixture with the correct polarity; the instrument will then display a graph similar to the one below:
5. Read the amplification factor test value.
Since the transistor's amplification factor β=IC/IB, it is necessary to read both the IC and IB values to calculate the amplification factor. The "Current/Div" knob on the instrument panel sets the value per division for IC, and the "Current-Voltage/Step" knob sets the value per step for IB. The IC value is read by the number of vertical divisions on the graph, while the IB value is read by the number of waveform steps. Assuming the test waveform in the above figure as an example: the "Current/Div" knob is set to 10mA, and the "Current-Voltage/Step" knob is set to 1mA. From the waveform in the figure, it can be seen that the waveform occupies 3.4 vertical divisions, and the number of steps is 2. Therefore, the amplification factor is calculated as follows:
β=IC/IB=(10mA×3.4 divisions)÷(1mA×2 steps)=34mA÷2mA=17
6. If further testing is required, repeat steps 4-5. After testing is complete, turn off the instrument power. [4]
1. When inserting the transistor under test into the test port, always ensure correct polarity to avoid damaging the component's performance.
2. During MOS tube voltage withstand testing, high voltage is output at the test port. Do not allow any part of the human body to contact the test port or the pins of the component under test to prevent electric shock.
3. Keep the instrument and test fixtures clean at all times to reduce or eliminate test errors caused by excessive dust in the test ports.
4. Report promptly when the instrument has significant test errors or other malfunctions.
