Transistor Curve Tracer
Features of this instrument
a. The intelligent high-power curve tracer breaks the traditional curve tracer that displays curves on a CRT; instead, it uses computer control to perform measurement tasks and displays curve images through a computer monitor.
b. The intelligent high-power curve tracer provides a high voltage source (up to 3kV) and a high current source (up to 400A). Its performance specifications are the same as the Tek371.
c. It uses the Kelvin connection method for sensing in high-current measurement mode. The purpose of the Kelvin connection is to separate the sensing leads from the power leads, which improves measurement accuracy by eliminating voltage drop caused by contact resistance.
d. It provides a sweep mode during high-current testing, making it convenient for users to observe the characteristic curves of high-power devices.
e. It uses computer control to display curves; it adds a human-machine interface, interactive dialogue, software panels, multi-window display, image storage, computer printing of curve images, and database editing functions.
f. It provides point marking testing; reads out measured values; reduces errors caused by human visual estimation.
g. The intelligent high-power curve tracer has a wide range of applications in the semiconductor testing field. For example: semiconductor analysis testing, semiconductor failure analysis, semiconductor incoming inspection, comparison of semiconductor device characteristics, and semiconductor factory testing.
Transistor Curve Tracer
System Block Diagram
A PCI interface card and BJ4822 operating software are installed on the computer; the computer controls the BJ4822 test mainframe via the PCI bus; it also reads data from the acquisition memory of the BJ4822 test mainframe; the characteristic curves of semiconductor devices are displayed through the BJ4822 operating software. Point marking testing is provided. Test devices can be connected to the test box via test adapters, or directly via test leads; each source is connected to the test box panel; users can select different sources as needed to inject into the various pins of the device under test.
Main Technical Specifications
(1) Collector Pulse Source (High Current Source):
Short-circuit current: 3kW—maximum short-circuit current 400A;
300W—maximum short-circuit current 40A;
Open-circuit voltage: 30V (+10%, -5%)
Adjustable range: continuously adjustable from 0% to 100%, resolution 0.5%
Pulse width: 300μs±10%
Repetition frequency: 3kW—1/4 power frequency; 300W—1/2 power frequency
(2) Collector Sweep Source (High Voltage Source):
Short-circuit current: 30W—40mA; 3W—4mA;
Open-circuit voltage: 3kV (+10%, -0%)
Adjustable range: continuously adjustable from 0% to 100%, resolution 0.1%
(3) Step Voltage Source:
Step amplitude range: 200mV/step—5V/step (in 1-2-5 sequence); 5 ranges in total; error for each range ≤±3%
Number of steps: 0—5 steps continuously variable
(4) Step Current Pulse Source:
Step range: 1mA/step—2A/step (in 1-2-5 sequence); 11 ranges in total; error for each range ≤±3%
Pulse width: 550μs±10%
Number of steps: 0—5 steps continuously variable
(5) Step Current Source:
Step range: 1μA/step—2mA/step (in 1-2-5 sequence); 11 ranges in total; error for each range ≤±3%
Number of steps: 0—5 steps continuously variable
(6) Horizontal Voltage Measurement:
(a) Vce voltage source settings (in 1-2-5 sequence):
3kW, 300W: 100mV/div—5V/div (in 1-2-5 sequence); 5 ranges in total; error for each range ≤±3%
30W, 3W: 50V/div—500V/div (in 1-2-5 sequence); 4 ranges in total; error for each range ≤±5%
(b) Vbe voltage source
