Functional Analysis and Structural Description of Microcomputer-Based Capacitance and Inductance Tester


The microcomputer-based capacitance and inductance tester uses a high-precision 50mm clamp-type CT for current detection, combined with a digitally isolated voltage detection circuit, ensuring stable performance and high measurement accuracy. The instrument features a backlit large-screen LCD display, which is clearly visible both day and night. It uses a Chinese menu, making operation very simple. The instrument can store 128 sets of measurement data and comes with a built-in thermal printer for printing measurement data.



The microcomputer-based capacitance and inductance tester is a dedicated instrument for testing compensation capacitors without disconnecting the lines. The instrument outputs a test current of up to 20A, and the capacitance can be measured up to 2200μF. The instrument has anti-interference capability and can be used in environments with strong electrical interference on site.



Structural Description of the Microcomputer-Based Capacitance and Inductance Tester:



 1 is the 2V20A output terminal. One end of the test voltage cable is connected to the "voltage output" terminal, and the cable clamps at the other end are respectively clamped onto the connecting busbars of the two poles of the capacitor bank under test. When testing reactors with inductance less than 5mH or resistors with resistance less than 1.25Ω, connect to the 2V voltage output terminal.



2 is the 30V/20A AC output terminal. One end of the test voltage cable is connected to the "voltage output" terminal, and the cable clamps at the other end are respectively clamped onto the connecting busbars of the two poles of the capacitor bank under test. For capacitor testing, the 30V voltage is used directly.



3 is the current input. The current signal input terminal; the test current signal cable is plugged into the "current input" input plug, and the other end is connected to the clamp meter.



4 is the LCD screen, displaying functions and data.